For example: in the 1MHz test frequency, the allocation will be 250 mu H inductor,in the 50MHz test frequency, the allocation will be 0.1 mu H inductors.

高頻介質(zhì)樣品（選購(gòu)件）：

High frequency dielectric samples (optional):

在現(xiàn)行高頻介質(zhì)材料檢定系統(tǒng)中，檢定部門為高頻介質(zhì)損耗測(cè)量?jī)x提供的測(cè)量標(biāo)準(zhǔn)是高頻標(biāo)準(zhǔn)介質(zhì)樣品。

In the current high frequency dielectric material test system, verification departmentfor measurement standards provide high frequency dielectric loss measuring instrument is high frequency standard media sample.

該樣品由人工藍(lán)寶石，石英玻璃，氧化鋁陶瓷，聚四氟乙烯，環(huán)氧板等材料做成Φ50mm，厚1～2mm測(cè)試樣品。用戶可按需訂購(gòu)，以保證測(cè)試裝置的重復(fù)性和準(zhǔn)確性。

The sample consists of artificial sapphire, quartz glass, alumina ceramics, PTFE,epoxy board and other materials made of diameter 50mm, thickness 1 ~ 2mm test sample. The user can according to need to order, to ensure the repeatability and accuracy of the test device.

介電常數(shù)介質(zhì)損耗測(cè)試儀特點(diǎn)：

The dielectric constant, dielectric loss tester features:

◎ 本公司創(chuàng)新的自動(dòng)Q值保持技術(shù)，使測(cè)Q分辨率至0.1Q，使tanδ分辨率至0.00005 。

Automatic Q \ \ the company innovation value keeping technology, enabling the measurement resolution of Q to 0.1Q, the tan delta resolution to 0.00005.

◎ 能對(duì)固體絕緣材料在10kHz～120MHz介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測(cè)試。

The energy of solid insulating materials in dielectric loss angle of 10kHz ~ 120MHz(tan delta) and Permittivity (epsilon) change test.

◎ 調(diào)諧回路殘余電感值低至8nH，保證100MHz的(tanδ)和(ε)的誤差較小。

The tuning circuit residual inductance values as low as 8nH, ensure that 100MHz(tan delta) and (E) the error is small.

◎ 特制LCD屏菜單式顯示多參數(shù)：Q值，測(cè)試頻率，調(diào)諧狀態(tài)等。

Multi parameter \ \ a special LCD screen menu display: Q value, the test frequency,the tuning status.

◎ Q值量程自動(dòng)/手動(dòng)量程控制。

The Q value range automatic / manual range control.

◎ DPLL合成發(fā)生1kHz～60MHz, 50kHz～160MHz測(cè)試信號(hào)。獨(dú)立信號(hào) 源輸出口，所以本機(jī)又是一臺(tái)合成信號(hào)源。

The DPLL synthesis occurs 1kHz ~ 60MHz, 50kHz ~ 160MHz test signal.Independent signal source output port, so the machine is a synthetic signal source.

◎ 測(cè)試裝置符合國(guó)標(biāo)GB/T 1409-2006,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。

The test device to meet the national standard GB/T 1409-2006, ASTM D150 and IEC60250 specifications American Standard.

介電常數(shù)和介質(zhì)損耗測(cè)試儀工作頻率范圍是10kHz～120MHz,它能完成工作頻率內(nèi)材料的高頻介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測(cè)試。

The dielectric constant and dielectric loss tester operating frequency range is 10kHz ~ 120MHz, it can complete the working frequency of high frequency dielectric loss angle within (tan delta) and Permittivity (epsilon) change test.

本儀器中測(cè)試裝置是由平板電容器和測(cè)微圓筒線性電容器組成，平板電容器一般用來(lái)夾被測(cè)樣品，配用Q表作為指示儀器。

The instrument testing device is composed of a parallel plate capacitor and a micrometer cylinder linear capacitors, capacitor plate is generally used to clamp the sample, equipped with the Q table as indicating instrument.

絕緣材料的損耗角正切值是通過(guò)被測(cè)樣品放入平板電容器和不放樣品的Q值變化和厚度的刻度讀數(shù)通過(guò)公式計(jì)算得到。

Insulating material loss angle tangent value is calculated by the formula of scale reading through the measured sample into a flat capacitor and lofting products of Q value change and the thickness of the obtained.

同樣，由測(cè)微圓筒線性電容器的電容量讀數(shù)變化，通過(guò)公式計(jì)算得到介電常數(shù)。

Similarly, capacitance micrometer readings by change of cylindrical linearcapacitors, to obtain the dielectric constant calculated by the formula.

介電常數(shù)介質(zhì)損耗測(cè)試儀主要技術(shù)指標(biāo)：

The main technical indexes of the dielectric constant of dielectric loss tester:

2.1 tanδ和ε性能：

2.1 tan delta and epsilon performance:

2.1.1 固體絕緣材料測(cè)試頻率10kHz～120MHz的tanδ和ε變化的測(cè)試。

2.1.1 solid insulating materials testing frequency of 10kHz ~ tan delta and epsilonchanges in 120MHz test.

2.1.2 tanδ和ε測(cè)量范圍：

2.1.2 tan delta and epsilon measurement range:

tanδ：0.1～0.00005，ε：1～50

Tan delta: 0.1 ~ 0.00005, epsilon: 1 ~ 50

2.1.3 tanδ和ε測(cè)量精度（1MHz）：

2.1.3 tan delta and epsilon measurement precision (1MHz):

tanδ：±5%±0.00005，ε：±2%

Tan delta: + 5% + 0.00005, + 2% epsilon:

工作頻率范圍：50kHz～50MHz 四位數(shù)顯，壓控振蕩器

Frequency range: 50kHz ~ 50MHz four digits, voltage controlled oscillator

Q值測(cè)量范圍：1～1000三位數(shù)顯，±1Q分辨率

Q value measuring range: 1 ~ 1000 three digit display, plus or minus 1Q resolution

可調(diào)電容范圍：40～500 pF ΔC±3pF

Adjustable capacitance range: 40 ~ 500 pF Delta C + 3pF

電容測(cè)量誤差：±1%±1pF

Capacitance measurement error: + 1% + 1pF

Q表殘余電感值：約20nH

Residual inductance Q table: about 20nH

介電常數(shù)介質(zhì)損耗測(cè)試儀裝置：

The dielectric constant, dielectric loss tester:

2.3.1 平板電容器極片尺寸：:Φ38mm和Φ50mm二種.

2.3.1 plate capacitor pole piece size: diameter 38mm and a 50mm of two.

2.3.2 平板電容器間距可調(diào)范圍和分辨率：0～8mm， ±0.01mm

2.3.2 capacitor plate spacing adjustable range and resolution: 0 ~ 8mm, + 0.01mm

2.3.3 圓筒電容器線性： 0.33 pF /mm±0.05 pF,

2.3.3 cylindrical capacitor linear: 0.33 pF /mm + 0.05 pF,

2.3.4 圓筒電容器可調(diào)范圍：±12.5mm（±4.2pF）

2.3.4 cylindrical capacitor adjustable range: + 12.5mm (+ 4.2pF)

2.3.5 裝置插頭間距：25mm±0.1mm

2.3.5 device plug spacing: 25mm + 0.1mm

2.3.6 裝置損耗角正切值:≤2.5×10-4

2.3.6 device loss tangent: less than 2.5 * 10-4

標(biāo)簽：

介電常數(shù)測(cè)試儀

介電常數(shù)介質(zhì)損耗測(cè)試儀

介質(zhì)損耗因數(shù)測(cè)試儀

介電常數(shù)和介質(zhì)損耗測(cè)試儀

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