晶體結(jié)構(gòu)：?jiǎn)涡绷?br data-filtered="filtered" style="box-sizing: border-box;"/>晶胞參數(shù)：a = 0.5864nm，B = 0.3918nm，C = 1.009nm，α=γ= 90°，γ= 98
晶體類(lèi)型：合成
晶體純度：＞99.995%晶體尺寸：8毫米
表征方法：XRD、拉曼、EDX
X-ray diffraction on a ZrTe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8
Powder X-ray diffraction (XRD) of a single crystal ZrTe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal ZrTe3 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal ZrTe3. Measurement was performed with a 785 nm Raman system at room temperature.
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